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The thickness dependence of the interband transition photovoltaic voltage and the short-circuit photocurrent in zinc sulphide photocells

Identifieur interne : 001673 ( France/Analysis ); précédent : 001672; suivant : 001674

The thickness dependence of the interband transition photovoltaic voltage and the short-circuit photocurrent in zinc sulphide photocells

Auteurs : M. Arsalane [France] ; A. J. Tosser [France]

Source :

RBID : ISTEX:C5995C0259F97148C443977DEE01EBDE65F4DDF0

Abstract

Using previously proposed band models calculations are given to determine the open-circuit photovoltages Vpho and the short-circuit currents Iphsc that are induced by light with an energy of more than 3.66 eV in Al/ZnS/Au photocells. The assumption that the interband photo-transitions and the electronic photo-emission from coulombic centres are separate may be used for sulphide thicknesses of more than 200 Å; the variations of Vpho and Iphsc with light intensity are only attributed to the interband transition. For sulphide thicknesses less than 200 Å the conduction band is perturbed twice because of the critical layer; photo-emission from the coulombic centres is enhanced; experimental thickness dependences are proposed that deviate markedly from the theoretical laws.

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DOI: 10.1016/0040-6090(77)90419-9


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ISTEX:C5995C0259F97148C443977DEE01EBDE65F4DDF0

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